Publication: Distribution Fitting for Long Term Electric Field Strength Measurements
| dc.authorscopusid | 16230640200 | |
| dc.authorscopusid | 43261063600 | |
| dc.contributor.author | Kurnaz, C. | |
| dc.contributor.author | Korunur Engiz, B.K. | |
| dc.date.accessioned | 2020-06-21T13:27:00Z | |
| dc.date.available | 2020-06-21T13:27:00Z | |
| dc.date.issued | 2017 | |
| dc.department | Ondokuz Mayıs Üniversitesi | en_US |
| dc.department-temp | [Kurnaz] Çetin, Department of Electrical and Electronic Engineering, Ondokuz Mayis Üniversitesi, Samsun, Turkey; [Korunur Engiz] Begüm, Department of Electrical and Electronic Engineering, Ondokuz Mayis Üniversitesi, Samsun, Turkey | en_US |
| dc.description.abstract | As a result of the enormous increase in usage of wireless systems; electromagnetic radiation (EMR) sources in residential areas as well as the exposed EMR levels has increased significantly. Therefore this study aims to determine the exposed E levels and characterize the electromagnetic environment on the basis of long term (24 hours) E measurements conducted at five different home environments. The measurements were collected using PMM 8053 EMR meter in band from 100 kHz to 3 GHz, and the electric field strength (E) was recorded. The measurement results show that the E originating from the base stations change significantly within a day, and the highest E is 6.21 V/m and the highest mean E is 3.59 V/m. Analysis of 24 hour measurements so as to division of a day into four equal parts show that afternoon and evening E levels are comparatively higher than those recorded during morning and night. Morning E level increases by 80.61% compared to night. At the end of the study to characterize the measured E levels with a distribution; fitting methods are applied to measured data. Since a Weibull distribution yield the lowest NRMSE; appears to be a candidate for a representation of the distribution of the measured E levels. © 2017 IEEE. | en_US |
| dc.identifier.doi | 10.1109/TSP.2017.8075984 | |
| dc.identifier.endpage | 270 | en_US |
| dc.identifier.isbn | 9781509039821 | |
| dc.identifier.scopus | 2-s2.0-85042751992 | |
| dc.identifier.startpage | 267 | en_US |
| dc.identifier.uri | https://doi.org/10.1109/TSP.2017.8075984 | |
| dc.identifier.wos | WOS:000425229000058 | |
| dc.language.iso | en | en_US |
| dc.publisher | Institute of Electrical and Electronics Engineers Inc. | en_US |
| dc.relation.ispartof | -- 40th International Conference on Telecommunications and Signal Processing, TSP 2017 -- 2017-07-05 through 2017-07-07 -- Barcelona -- 131314 | en_US |
| dc.relation.journal | 2017 40Th International Conference on Telecommunications and Signal Processing (Tsp) | en_US |
| dc.relation.publicationcategory | Konferans Öğesi - Uluslararası - Kurum Öğretim Elemanı | en_US |
| dc.rights | info:eu-repo/semantics/closedAccess | en_US |
| dc.subject | E Distribution | en_US |
| dc.subject | Electric Field Strength | en_US |
| dc.subject | Electromagnetic (EM) Measurement | en_US |
| dc.subject | EM Pollution | en_US |
| dc.subject | Statistical Analysis | en_US |
| dc.title | Distribution Fitting for Long Term Electric Field Strength Measurements | en_US |
| dc.type | Conference Object | en_US |
| dspace.entity.type | Publication |
