Publication:
Distribution Fitting for Long Term Electric Field Strength Measurements

dc.authorscopusid16230640200
dc.authorscopusid43261063600
dc.contributor.authorKurnaz, C.
dc.contributor.authorKorunur Engiz, B.K.
dc.date.accessioned2020-06-21T13:27:00Z
dc.date.available2020-06-21T13:27:00Z
dc.date.issued2017
dc.departmentOndokuz Mayıs Üniversitesien_US
dc.department-temp[Kurnaz] Çetin, Department of Electrical and Electronic Engineering, Ondokuz Mayis Üniversitesi, Samsun, Turkey; [Korunur Engiz] Begüm, Department of Electrical and Electronic Engineering, Ondokuz Mayis Üniversitesi, Samsun, Turkeyen_US
dc.description.abstractAs a result of the enormous increase in usage of wireless systems; electromagnetic radiation (EMR) sources in residential areas as well as the exposed EMR levels has increased significantly. Therefore this study aims to determine the exposed E levels and characterize the electromagnetic environment on the basis of long term (24 hours) E measurements conducted at five different home environments. The measurements were collected using PMM 8053 EMR meter in band from 100 kHz to 3 GHz, and the electric field strength (E) was recorded. The measurement results show that the E originating from the base stations change significantly within a day, and the highest E is 6.21 V/m and the highest mean E is 3.59 V/m. Analysis of 24 hour measurements so as to division of a day into four equal parts show that afternoon and evening E levels are comparatively higher than those recorded during morning and night. Morning E level increases by 80.61% compared to night. At the end of the study to characterize the measured E levels with a distribution; fitting methods are applied to measured data. Since a Weibull distribution yield the lowest NRMSE; appears to be a candidate for a representation of the distribution of the measured E levels. © 2017 IEEE.en_US
dc.identifier.doi10.1109/TSP.2017.8075984
dc.identifier.endpage270en_US
dc.identifier.isbn9781509039821
dc.identifier.scopus2-s2.0-85042751992
dc.identifier.startpage267en_US
dc.identifier.urihttps://doi.org/10.1109/TSP.2017.8075984
dc.identifier.wosWOS:000425229000058
dc.language.isoenen_US
dc.publisherInstitute of Electrical and Electronics Engineers Inc.en_US
dc.relation.ispartof-- 40th International Conference on Telecommunications and Signal Processing, TSP 2017 -- 2017-07-05 through 2017-07-07 -- Barcelona -- 131314en_US
dc.relation.journal2017 40Th International Conference on Telecommunications and Signal Processing (Tsp)en_US
dc.relation.publicationcategoryKonferans Öğesi - Uluslararası - Kurum Öğretim Elemanıen_US
dc.rightsinfo:eu-repo/semantics/closedAccessen_US
dc.subjectE Distributionen_US
dc.subjectElectric Field Strengthen_US
dc.subjectElectromagnetic (EM) Measurementen_US
dc.subjectEM Pollutionen_US
dc.subjectStatistical Analysisen_US
dc.titleDistribution Fitting for Long Term Electric Field Strength Measurementsen_US
dc.typeConference Objecten_US
dspace.entity.typePublication

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