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dc.contributor.authorKaplan, S
dc.contributor.authorCanan, S
dc.contributor.authorAslan, H
dc.contributor.authorUnal, B
dc.contributor.authorSahin, B
dc.date.accessioned2020-06-21T15:49:07Z
dc.date.available2020-06-21T15:49:07Z
dc.date.issued2001
dc.identifier.issn0022-2720
dc.identifier.urihttps://doi.org/10.1046/j.1365-2818.2001.00931.x
dc.identifier.urihttps://hdl.handle.net/20.500.12712/22148
dc.descriptionSahin, Bunyamin/0000-0001-8538-8443; Kaplan, Suleyman/0000-0003-1477-5002; Canan, Sinan/0000-0002-9864-1767en_US
dc.descriptionWOS: 000170905100011en_US
dc.descriptionPubMed: 11555150en_US
dc.description.abstractMeasurements of microscope stage movements in the x and y directions are of importance for some stereological methods such as the optical disector and optical fractionator. The length of stage movements can be measured with great precision and accuracy using a suitable motorized stage, which is generally a computer-assisted instrument. This type of equipment is generally too expensive for and not readily available in many laboratories. This paper describes a simple method to measure the movements of the microscope stage along the x and y directions, which can be used for purposes such as systematic uniform random sampling. It needs a microscope attachment consisting of two dial indicators; one of them is used to measure the amount of stage movement along the x-axis and the other measures the amount of movement along the y-axis. Movements of the stage on the micrometre-scale can be measured easily using this device.en_US
dc.language.isoengen_US
dc.publisherBlackwell Science Ltden_US
dc.relation.isversionof10.1046/j.1365-2818.2001.00931.xen_US
dc.rightsinfo:eu-repo/semantics/closedAccessen_US
dc.subjectdial indicatoren_US
dc.subjectmicroscope stageen_US
dc.subjectstereologyen_US
dc.subjectsystematic uniform random samplingen_US
dc.subjectx and y axesen_US
dc.titleA simple technique to measure the movements of the microscope stage along the x and y axes for stereological methodsen_US
dc.typearticleen_US
dc.contributor.departmentOMÜen_US
dc.identifier.volume203en_US
dc.identifier.startpage321en_US
dc.identifier.endpage325en_US
dc.relation.journalJournal of Microscopy-Oxforden_US
dc.relation.publicationcategoryMakale - Uluslararası Hakemli Dergi - Kurum Öğretim Elemanıen_US


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