Yayıncı "Ieee, Electron Devices Soc & Reliability Group" WoS İndeksli Yayınlar Koleksiyonu için listeleme
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Fault identification in transformers through a fuzzy discrete event system approach
(Ieee, Electron Devices Soc & Reliability Group, 2007)A new fault detection and identification (FDI) scheme for transformer faults are suggested in this paper. The new method is based on fuzzy discrete event, from now FDES, composed from between a transformer's measured outputs ...
