Non-destructive leaf area estimation in peach

Abstract

In this research, a model for predicting the leaf area was developed for peach by using 'Earlyred', 'Dixired', 'Cardinal', 'Redhaven', 'Glohaven' and 'Crest-haven' cvs. by measuring lamina width, length and leaf area without destroying in 2002. Multiple regression analysis for the cultivars was separately performed. The proposed leaf area (LA) prediction model is: LA=-0.5+0.23*L/W+0.67*L*W, R-2=0.9975, LA is leaf area, W is leaf width, L is leaf length. The model was validated by measuring leaf samples of different peach trees of the six cultivars in 2003.